Publications




A.K. Kulkarni, Kirk H. Schulz, T.S. Lim, M. Khan, "Dependence of the sheet resistance of indium-tin-oxide thin films on grain size and grain orientation determined from X-ray diffraction techniques," Thin Solid Films 345 (1999) 273-277


A.K. Kulkarni, K.H. Schulz, T.-S. Lim, M. Khan, "Electrical, optical and structural characteristics of indium-tin-oxide thin films deposited on glass and polymer substrates," Thin Solid Films 308–309 (1997) 1–7

A.K. Kulkarni, L.C. Chang, "Electrical and structural characteristics of chromium thin films deposited on glass and alumina substrates," Thin Solid Films 301
(1997)17–22


AK. Kulkarni, K. Tey, H. Rodrigo , "Electrical characterization of CVD diamond thin films grown on silicon substrates," Thin Solid Films 270 ( 1995) 189-193

A.K. Kulkarni, A Shrotriya, P. Cheng, H. Rodrigo, R. Bashyam, D.J. Keeble, " Electrical properties of diamond thin films grown by chemical vapor deposition technique," Thin Solid Films 253 (1994) 141-145

A.K. Kulkarni, L Jianhua, "Schottky Barrier Enhancement in Ni/Al Layer-by-Layer Contacts to n-GaAs," IEEE University/Government/Microelectronics Symposium (1991) 216-221

A. K. Kulkarni;  G. A. Rohrer;  S. Narayan; L. D. Mcmillan, " A circuit model for a thin film ferroelectric memory device," Ferroelectrics 116 (1991) 95-106

A.K. Kulkarni, G.A. Rohrer, "Development of Ferroelectric Materials for Memory Applications,"   IEEE University/Government/Microelectronics Symposium (1989) 150-155


A.K. Kulkarni, J.T. Lukowski, "Effects of annealing process parameters on the properties of AuGe ohmic contacts to GaAs," J. Appl. Phys. 59 (8), 15 April 1986